Polish Wafer / Test Wafer 抛光晶圆

产品与服务 > Silicon Substrate > Polish Wafer / Test Wafer

We offer a wide range of polished silicon wafers, categorized by application into neutron-transmutation-doped (NTD), high-resistivity, gas-doped, and conventional CZ-grown types. Our product portfolio covers various crystal growth methods including FZ, CZ, and MCZ, making them suitable for diverse industries such as power electronics, high-energy physics, communications, and optoelectronics.

Growth Method FZ ( NTD ) FZ GDFX CFZ CZ MCZ
Conductivity Type N N & P
Surface Orientation <100>, <111> <100>, <111>, <110>
Diameter 3" ~ 5" 4" ~ 8" 4" ~ 12"
Resistivty Capability 30 ~ 800 > 1000 0.001 ~ 300 1 ~ 50 0.001 ~ 100